TEST optimize

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l4m2

Joined: 15 Jan 2015
Posts: 657

l4m2

usually we use a dword value to store some bits and get one by

Code:

ATTR equ 0x2000
;...
test dword [esi], dword ATTR

but obviously it's a better choice if we use

Code:

test byte [esi+1], 0x20

So I wrote this. Bugs can be reported here.

Code:

macro test op1, op2 {
    local tmp1, tmp2
    tmp1 equ *
    match w[x], :op1 \{
        tmp1 equ x
    \}
    tmp2 equ op2
    match w x, op2 \{
        if w eqtype word
            tmp2 equ x
        end if
    \}
    if ~(tmp1 eq *) & tmp2 eqtype 0
        if ~(tmp2 and not 0xff)
            test byte [tmp1], tmp2
        else if ~(tmp2 and not 0xff00)
            test byte [tmp1+1], tmp2 shr 8
        else if ~(tmp2 and not 0xff0000)
            test byte [tmp1+2], tmp2 shr 16
        else if ~(tmp2 and not 0xff000000)
            test byte [tmp1+3], tmp2 shr 24
        else
            test op1, op2
        end if
    else
        test op1, op2
    end if
}

06 Sep 2015, 02:44

sinsi

Joined: 10 Aug 2007
Posts: 713
Location: Adelaide

sinsi

Unaligned memory access makes it slower. Why not use BT?

06 Sep 2015, 04:02

revolution
When all else fails, read the source

Joined: 24 Aug 2004
Posts: 17717
Location: In your JS exploiting you and your system

revolution

There are already some existing macros for this (and LEA) optimisations. They are from a few years ago but a bit of searching should be able to find them.

06 Sep 2015, 04:14

revolution
When all else fails, read the source

Joined: 24 Aug 2004
Posts: 17717
Location: In your JS exploiting you and your system

revolution

For your viewing convenience I found the old thread:

http://board.flatassembler.net/topic.php?t=1238

Please read the whole thread, there is a lot of thoughts and information presented there.

06 Sep 2015, 07:23

l4m2

Joined: 15 Jan 2015
Posts: 657

l4m2

sinsi wrote:

Unaligned memory access makes it slower. Why not use BT?

Code:

bt dword [ebx], 1  ;4 bytes
test byte [ebx], 2 ;3 bytes

06 Sep 2015, 10:47

l4m2

Joined: 15 Jan 2015
Posts: 657

l4m2

It's not a good idea that fasm itself compile TEST [EBX], DWORD 0x20 into TEST [EBX], BYTE 0x20. In a segment 0-18, if EBX is 16, the first one rise a fault while the second one doesn't.

11 Sep 2015, 15:20

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